Design & Characterization
Many test set-ups have been developed at III-V Lab for the characterization of the different
types of devices and circuits such as:
- near-field or far-field and chirp monitoring of optical laser sources and modulators,
- responsivity and noise of single or arrayed photodetectors,
- microwave S parameters and large signal non linear measurements of electronic devices.
While thermal and electronic modeling, device and circuit designs mostly rely on commercially available softwares, sometimes complemented by specific internal codes,
a number of in-house softwares have been developed for guided-wave optoelectronic devices, anticipating the capabilities of commercial ones.
||Modeling of the evanescent coupling from a multimode diluted MQW waveguide to the absorption layer of a photodiode.
||Amplitude and phase of optical pulses generated by a self-pulsating Distributed Bragg Reflector (DBR) 1.55 µm laser.
Pulse duration is about 2.7 ps
|Design of MMIC - MMIC after processing.